信頼性データ

オン・セミコンダクタは製品ポートフォリオのすべてのデバイスに対して、幅広い信頼性ストレス試験を実施します。 信頼性データは、オン・セミコンダクタ信頼性監査プログラムの一環として、また通常の製品認定および再認定プロセスの一環として収集されます。 このデータは最新の試験結果を反映させるために、定期的に更新されます。 このデータは通常、四半期ごとに更新されます。 現行データは常にこの Web サイトを通じて検索できます。
オン・セミコンダクタのオンライン FIT および MTBF/MTTF カルキュレータを使用するか、オン・セミコンダクタ製品番号から信頼性データの検索が可能な Windows アプリケーションをダウンロードできます。 また、アプリケーションを CD 版でご注文いただくことも可能です。 また、このデータのサマリ（pdf フォーマット）も提供されています。

信頼性データ - デバイス MTBF/MTTF/FIT

信頼性データを検索するデバイスを入力してください。 部分的に一致すると、デバイスの一覧が表示され、検索を続けることができます。
["TRENCH FET","ONC25","U2","ZENER","CMOS SUB","TRENCH FET LEGACY","CMOS STD","BP STD LINEAR","ONC18","TM","TRENCH SUB","BN,GA","VHVIC","CIS 25is","HVFET","32","SST","MOSAIC","RECT","TRENCH MV","RN","BPT","GK,RN,U4","3A","IGBT","29,RN","2C","BB,BM,GA","SSD","MJ","GA,PD","3D","T3","HD3e","T9","SIC","BD","40","CIS 26is","T2","IPD2","U1","3C","AHPM15","CIS 100is","3C,40","CE","I3T","TRENCH IGBT","U4","40,CE","3B","TMOS STD","64,CE","BN","3","T7","3B,IJ","IGN IGBT","TP","CIS 40is","GA","T5","BB,GA","TT","TV","64","64,AC","3D,64","BB","3B,IL","8","PD","9","3B,40,IL","2D,3C,7Z,IL","TR","3B,IM","BB,RN,U4","RM","BiDCMOS","36","CIS 65is ","TQ","T2,T3","BM,GA","AC,BJ","DrMOS BCD + PT MCM","TMOS 7","CG","CN","2F,3B","ANALOG","CF","AC","BB,T3","GK,RH","GK,RM,U4","RM,U4","03,3B,40,IL","7S","29,3C","BJ","3B,40,IK","T5,TV","T1","3B,3C,40","RF","S3","3B,40,IJ","T3,TT","3H","29,T7","BB,RH","IPM","BM","10","T2,TT","03,AC","TO","07,3B,IL,IM","34,3C","29,RM,U4","3B,IK","3B,7Z,IJ,IO","CM","3B,40,IJ,TM","S1,TV","8C,T5","34,3D","T7,TR","RP","T1,TT","3A,40","RN,U4","34","BL","AC,CN","2D,3B,40,IJ,IK","R2","RH","2E,3B","RT","07,AC","T3,T5","RH,T3","S1,TT","T5,TT","3B,7Z,IJ,IM","RN,T7","3A,3B,40","CP","3D,CN","GK,U4","2H","03,3B,7Z,IL","U5","TQ,TR","RM,RN","TP,TQ","TP,TR","2B","TP,TT","34,AC","BB,RM,U4","RF,TP","RF,TT","TB,TR","TO,TR","03,2D,7Z,IL","8C","34,CE","BJ,CE","03,3A,3B,40,IL","3C,64","3B,40,7Z,IO","32,36","RF,T8","29,TV","RN,U5","36,TT","3B,IO","TR,TT","CE,CN","3D,BJ","RF,S1","SA","R2,RF"]
Disclaimer:
A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)
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